IJMLC 2013 Vol.3(4): 337-341 ISSN: 2010-3700
DOI: 10.7763/IJMLC.2013.V3.333

Failure Rate Calculation of PC’s SMPSs

B. Abdi, R. Ghasemi, and S. M. M. Mirtalaei

Abstract—Today reliability is one of the serious requirements of electronic systems. The numbers of system failures, repair cost, guarantee, etc are estimated by reliability estimation. In this paper, the reliability of a switching power supply, which is used for personal computers, evaluates. It will show that the most of failure rates depends on power circuit because of more stresses and dissipations. Derating effect of devices on the failure rate will discuss. Part stress count utilizes for failure rate calculations and a prototype’s waveforms uses for stress detection and calculation of dissipations.

Index Terms—Failure rate, reliability, SMPS, PC.

The Authors are with Damavand Branch, Islamic Azad University, Damavand, Tehran, Iran (e-mail: babakabdi@ieee.org).

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Cite:B. Abdi, R. Ghasemi, and S. M. M. Mirtalaei, "Failure Rate Calculation of PC’s SMPSs," International Journal of Machine Learning and Computing vol.3, no. 4, pp. 337-341, 2013.

General Information

  • ISSN: 2010-3700 (Online)
  • Abbreviated Title: Int. J. Mach. Learn. Comput.
  • Frequency: Bimonthly
  • DOI: 10.18178/IJMLC
  • Editor-in-Chief: Dr. Lin Huang
  • Executive Editor:  Ms. Cherry L. Chen
  • Abstracing/Indexing: Scopus (since 2017), Inspec (IET), Google Scholar, Crossref, ProQuest, Electronic Journals Library.
  • E-mail: ijmlc@ejournal.net